Research Article - (2016) Volume 7, Issue 4

Lifetime Assessment of POCT Strips through Accelerated Degradation Test

Jin-Young Choi1, In Mo Yang1, Tae-Ho Yoon2 and Sunmook Lee2*
1Advanced Materials Reliability Assessment Center, Korea Conformity Laboratories, 199, Gasandigital 1-ro, Geumchon-gu, Seoul 08503, The Republic of Korea
2Electronics and Telecommunications Research Institute, 218, Gajeong-ro, Yuseong-gu, Daejeon 34129, Republic of Korea
*Corresponding Author: